A note on generalized aberration in factorial designs

doi:10.1007/s001840100112

科研成果详情

发表状态	已发表Published
题名	A note on generalized aberration in factorial designs
作者	Ma, Changxing 1; Fang, Kaitai2,3
发表日期	2001
发表期刊	Metrika
ISSN/eISSN	0026-1335
卷号	53 期号:1 页码:85-93
摘要	In this paper we extend the wordlength pattern and minimum aberration for non-regular factorials. The new concepts, the generalized wordlength pattern and minimum generalized aberration, are proposed. Some connections between the generalized wordlength pattern and uniformity are given. Some applications of the new concepts in the Blackett and Burman's designs are discussed.
关键词	Code theory Discrepancy Generalized wordlength pattern Minimum aberration Orthogonal fractional factorial designs Uniform design Uniformity Wordlength pattern
DOI	10.1007/s001840100112
URL	查看来源
收录类别	SCIE
语种	英语English
WOS研究方向	Mathematics
WOS类目	Statistics & Probability
WOS记录号	WOS:000168479700007
Scopus入藏号	2-s2.0-0035648164
引用统计	被引频次：121[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	https://repository.uic.edu.cn/handle/39GCC9TT/2471
专题	个人在本单位外知识产出
作者单位	1.Department of Statistics, Nankai University, Tianjin, China 2.Hong Kong Baptist University, Chinese Academy of Sciences, Beijing, China 3.Chinese Acad Sci, Beijing, Peoples R China
推荐引用方式 GB/T 7714	Ma, Changxing,Fang, Kaitai. A note on generalized aberration in factorial designs[J]. Metrika, 2001, 53(1): 85-93.
APA	Ma, Changxing, & Fang, Kaitai. (2001). A note on generalized aberration in factorial designs. Metrika, 53(1), 85-93.
MLA	Ma, Changxing,et al."A note on generalized aberration in factorial designs". Metrika 53.1(2001): 85-93.