发表状态 | 已发表Published |
题名 | Reliable communication envelopes of molecular diffusion channels |
作者 | |
发表日期 | 2013-09-12 |
发表期刊 | Electronics Letters
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ISSN/eISSN | 0013-5194 |
卷号 | 49期号:19页码:1248-1249 |
摘要 | Radio frequency communications are not always possible in hostile electromagnetic environments, and the molecular diffusion channel is considered as an information channel. A binary concentration modulated channel is considered and treated is the uncertain arrival time of particles as the main source of inter-symbol interference. The analysis derives the bit-error-rate and data rate expressions for a diffusion channel with zero drift. The minimum error rate and maximum data rate are derived analytically. It is also found that in order for reliable communications to be possible, the delay time must be greater than a threshold that is proportional to the square of the communication distance. © The Institution of Engineering and Technology 2013. |
DOI | 10.1049/el.2013.1133 |
URL | 查看来源 |
收录类别 | SCIE |
语种 | 英语English |
WOS研究方向 | Engineering |
WOS类目 | Engineering, Electrical & Electronic |
WOS记录号 | WOS:000328860200033 |
Scopus入藏号 | 2-s2.0-84884867132 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | https://repository.uic.edu.cn/handle/39GCC9TT/10520 |
专题 | 个人在本单位外知识产出 |
作者单位 | 1.School of Engineering,University of Warwick,Warwickshire,United Kingdom 2.Institute for Telecommunications Research,University of South Australia,Australia 3.Department of Electrical Engineering and Computer Science,University of York,Canada 4.Mathematics Department,University of Swansea,Swansea,United Kingdom |
推荐引用方式 GB/T 7714 | Guo, Weisi,Wang, Siyi,Eckford, Andrewet al. Reliable communication envelopes of molecular diffusion channels[J]. Electronics Letters, 2013, 49(19): 1248-1249. |
APA | Guo, Weisi, Wang, Siyi, Eckford, Andrew, & Wu, Jianglun. (2013). Reliable communication envelopes of molecular diffusion channels. Electronics Letters, 49(19), 1248-1249. |
MLA | Guo, Weisi,et al."Reliable communication envelopes of molecular diffusion channels". Electronics Letters 49.19(2013): 1248-1249. |
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