Status | 已发表Published |
Title | Multilevel Similarity-Aware Deep Metric Learning for Fine-Grained Image Retrieval |
Creator | |
Date Issued | 2023-08-01 |
Source Publication | IEEE Transactions on Industrial Informatics
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ISSN | 1551-3203 |
Volume | 19Issue:8Pages:9173-9182 |
Abstract | Fast and accurate image retrieval is an important and challenging task in massive image data scenarios. As the core technology of image retrieval tasks, deep metric learning aims at learning effective embedding representations that possess two properties among data points: positive concentrated and negative separated. In this work, we propose a multilevel similarity-aware method based on deep local descriptors for deep metric learning. We take the rich interclass similarity relationship based on the deep local invariant descriptors from the data into account to optimize sampling strategies for mining informative samples. The method dynamically adjusts the margin between data points to better match the true similarity relationship between classes. Specifically, for images in a batch, we first obtain deep local descriptors and calculate the similarity matrix of the channel, pixel, and spatial levels. Then, depending on the calculated comprehensive similarity matrix, we propose a multilevel similarity-aware loss function through the deviation between pairwise distance and violate margin to make full use of informative samples. The experimental results demonstrate that our proposed method outperforms other state-of-the-art methods in terms of fine-grained image retrieval and clustering tasks. |
Keyword | Deep local descriptors deep metric learning (DML) fine-grained image retrieval similarity metric |
DOI | 10.1109/TII.2022.3227721 |
URL | View source |
Indexed By | SCIE |
Language | 英语English |
WOS Research Area | Automation & Control Systems ; Computer Science ; Engineering |
WOS Subject | Automation & Control Systems ; Computer Science, Interdisciplinary Applications ; Engineering, Industrial |
WOS ID | WOS:001030673600058 |
Scopus ID | 2-s2.0-85144776334 |
Citation statistics | |
Document Type | Journal article |
Identifier | http://repository.uic.edu.cn/handle/39GCC9TT/10803 |
Collection | Faculty of Science and Technology |
Corresponding Author | Feng, Yong |
Affiliation | 1.Chongqing University, College of Computer Science, Chongqing, 400044, China 2.Ministry of Natural Resources, Key Lab. of Monitoring, Evaluation and Early Warning of Territorial Spatial Planning Implementation, Chongqing, 401147, China 3.Chongqing Institute of Planning and Natural Resources Investigation and Monitoring, Chongqing, 401121, China 4.Zhejiang Lab, Hangzhou, 311121, China 5.Guilin University of Electronic Technology, Guangxi Key Laboratory of Trusted Software, Guilin, 541004, China 6.BNU-HKBU United International College Zhuhai, BNU-UIC Institute of Artificial Intelligence, Future Networks Beijing Normal University (BNU Zhuhai), Guangdong Key Lab of Ai and Multi-Modal Data Processing, Guangdong, 519087, China |
Recommended Citation GB/T 7714 | Duan, Congcong,Feng, Yong,Zhou, Minglianget al. Multilevel Similarity-Aware Deep Metric Learning for Fine-Grained Image Retrieval[J]. IEEE Transactions on Industrial Informatics, 2023, 19(8): 9173-9182. |
APA | Duan, Congcong., Feng, Yong., Zhou, Mingliang., Xiong, Xiancai., Wang, Yongheng., .. & Jia, Weijia. (2023). Multilevel Similarity-Aware Deep Metric Learning for Fine-Grained Image Retrieval. IEEE Transactions on Industrial Informatics, 19(8), 9173-9182. |
MLA | Duan, Congcong,et al."Multilevel Similarity-Aware Deep Metric Learning for Fine-Grained Image Retrieval". IEEE Transactions on Industrial Informatics 19.8(2023): 9173-9182. |
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