| Status | 已发表Published |
| Title | A note on generalized aberration in factorial designs |
| Creator | |
| Date Issued | 2001 |
| Source Publication | Metrika
 |
| ISSN | 0026-1335 |
| Volume | 53Issue:1Pages:85-93 |
| Abstract | In this paper we extend the wordlength pattern and minimum aberration for non-regular factorials. The new concepts, the generalized wordlength pattern and minimum generalized aberration, are proposed. Some connections between the generalized wordlength pattern and uniformity are given. Some applications of the new concepts in the Blackett and Burman's designs are discussed. |
| Keyword | Code theory Discrepancy Generalized wordlength pattern Minimum aberration Orthogonal fractional factorial designs Uniform design Uniformity Wordlength pattern |
| DOI | 10.1007/s001840100112 |
| URL | View source |
| Indexed By | SCIE |
| Language | 英语English |
| WOS Research Area | Mathematics |
| WOS Subject | Statistics & Probability |
| WOS ID | WOS:000168479700007 |
| Scopus ID | 2-s2.0-0035648164 |
| Citation statistics | |
| Document Type | Journal article |
| Identifier | http://repository.uic.edu.cn/handle/39GCC9TT/2471 |
| Collection | Research outside affiliated institution |
| Affiliation | 1.Department of Statistics, Nankai University, Tianjin, China 2.Hong Kong Baptist University, Chinese Academy of Sciences, Beijing, China 3.Chinese Acad Sci, Beijing, Peoples R China |
| Recommended Citation GB/T 7714 | Ma, Changxing,Fang, Kaitai. A note on generalized aberration in factorial designs[J]. Metrika, 2001, 53(1): 85-93. |
| APA | Ma, Changxing, & Fang, Kaitai. (2001). A note on generalized aberration in factorial designs. Metrika, 53(1), 85-93. |
| MLA | Ma, Changxing,et al."A note on generalized aberration in factorial designs". Metrika 53.1(2001): 85-93. |
| Files in This Item: | There are no files associated with this item. | |||||
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