A connection between uniformity and aberration in regular fractions of two-level factorials

doi:10.1093/biomet/87.1.193

科研成果详情

发表状态	已发表Published
题名	A connection between uniformity and aberration in regular fractions of two-level factorials
作者	Fang, Kaitai1 ; Mukerjee, Rahul 2
发表日期	2000
发表期刊	Biometrika
ISSN/eISSN	0006-3444
卷号	87 期号:1 页码:193-198
摘要	We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular, excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration. © 2000 Biometrika Trust.
关键词	Centred L2-discrepancy Fractional factorial design Minimum aberration Uniformity Word-length pattern
DOI	10.1093/biomet/87.1.193
URL	查看来源
收录类别	SCIE
语种	英语English
WOS研究方向	Life Sciences & Biomedicine - Other Topics ; Mathematical & Computational Biology ; Mathematics
WOS类目	Biology ; Mathematical & Computational Biology ; Statistics & Probability
WOS记录号	WOS:000086307400016
Scopus入藏号	2-s2.0-33746409004
引用统计
文献类型	期刊论文
条目标识符	https://repository.uic.edu.cn/handle/39GCC9TT/2488
专题	个人在本单位外知识产出
作者单位	1.Department of Mathematics, Hong Kong Baptist University, Kowloon Tong, Hong Kong 2.Indian Institute of Management, Calcutta 700 027, Post Box No. 16757, India
推荐引用方式 GB/T 7714	Fang, Kaitai,Mukerjee, Rahul. A connection between uniformity and aberration in regular fractions of two-level factorials[J]. Biometrika, 2000, 87(1): 193-198.
APA	Fang, Kaitai, & Mukerjee, Rahul. (2000). A connection between uniformity and aberration in regular fractions of two-level factorials. Biometrika, 87(1), 193-198.
MLA	Fang, Kaitai,et al."A connection between uniformity and aberration in regular fractions of two-level factorials". Biometrika 87.1(2000): 193-198.