发表状态 | 已发表Published |
题名 | Optimal and robust detection of multivariate outliers for elliptically contoured distribution |
作者 | |
发表日期 | 1992 |
发表期刊 | Systems Science and Mathematical Sciences
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卷号 | 5期号:2页码:146-163 |
摘要 | The outlier problem for a multivariate elliptically contoured distribution's random sample with mean slippage is defined and the likelihood ratio test ofthe null hypothesis, in which there are no outliers, versus the alternative hypothesis, in which some outliers are present, is derived. We show that the testing problemis invariant under a group of affine transformations and obtain the maximal in-variance which is equivalent to the likelihood ratio testing statistic. Furthermore, the non-null and null density distribution functions of the likelihood ratio testingstatistic are derived. We find that the null density distribution function of thetesting statistic is robust and the density distribution function is a monotonical likelihood ratio function of the maximal invariance. Therefore, the likelihood ratiotest is a uniformly most powerful invariant test among the group of affine transfor-mations. In the last section, we give an example of detecting multivariate outliersin elliptically contoured distribution. |
关键词 | Outliers elliptically contoured distributions likelihood ratio criteria uniformly most powerful invariant test |
URL | 查看来源 |
语种 | 英语English |
文献类型 | 期刊论文 |
条目标识符 | https://repository.uic.edu.cn/handle/39GCC9TT/8402 |
专题 | 个人在本单位外知识产出 |
作者单位 | Institute of Applied Statistics,Yunnan University,Kunming 650091,China |
推荐引用方式 GB/T 7714 | Wang, Xueren,Pan, Jianxin. Optimal and robust detection of multivariate outliers for elliptically contoured distribution[J]. Systems Science and Mathematical Sciences, 1992, 5(2): 146-163. |
APA | Wang, Xueren, & Pan, Jianxin. (1992). Optimal and robust detection of multivariate outliers for elliptically contoured distribution. Systems Science and Mathematical Sciences, 5(2), 146-163. |
MLA | Wang, Xueren,et al."Optimal and robust detection of multivariate outliers for elliptically contoured distribution". Systems Science and Mathematical Sciences 5.2(1992): 146-163. |
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