Measuring the intensity of knowledge flow with patent statistics

doi:10.1016/S0165-1765(01)00558-4

Details of Research Outputs

Status	已发表Published
Title	Measuring the intensity of knowledge flow with patent statistics
Creator	Fung, Michael K.1; Chow, William W.2
Date Issued	2002
Source Publication	Economics Letters
ISSN	0165-1765
Volume	74 Issue:3 Pages:353-358
Abstract	Our study is based on the patent data of 224 firms in the computer, chemical, and electronic and electrical industries worldwide. We find that on average 19.3% of the knowledge spillover is generated within the industries, with the rest stemming from other industries. Also, there is a significant positive relationship between technological overlap between firms and internal knowledge flow in an industry. © 2002 Elsevier Science B.V. All rights reserved.
Keyword	Innovation Knowledge spillover Patent
DOI	10.1016/S0165-1765(01)00558-4
URL	View source
Indexed By	SSCI
Language	英语English
WOS Research Area	Business & Economics
WOS Subject	Economics
WOS ID	WOS:000173809900011
Scopus ID	2-s2.0-0036019617
Citation statistics	Cited Times:39[WOS] [WOS Record] [Related Records in WOS]
Document Type	Journal article
Identifier	http://repository.uic.edu.cn/handle/39GCC9TT/8433
Collection	Research outside affiliated institution
Affiliation	1.Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China 2.Department of Economics and HKUST Center for Economic Development,Hong Kong University of Science and Technology, Clearwater Bay, Kowloon, Hong Kong, China
Recommended Citation GB/T 7714	Fung, Michael K.,Chow, William W. Measuring the intensity of knowledge flow with patent statistics[J]. Economics Letters, 2002, 74(3): 353-358.
APA	Fung, Michael K., & Chow, William W. (2002). Measuring the intensity of knowledge flow with patent statistics. Economics Letters, 74(3), 353-358.
MLA	Fung, Michael K.,et al."Measuring the intensity of knowledge flow with patent statistics". Economics Letters 74.3(2002): 353-358.

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