发表状态 | 已发表Published |
题名 | A lower bound for the centered L2-discrepancy on asymmetric factorials and its application |
作者 | |
发表日期 | 2006 |
发表期刊 | Metrika
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ISSN/eISSN | 0026-1335 |
卷号 | 63期号:2页码:243-255 |
摘要 | The role of uniformity measured by the centered L 2-discrepancy (Hickernell 1998a) has been studied in fractional factorial designs. The issue of a lower bound for the centered L 2-discrepancy is crucial in the construction of uniform designs. Fang and Mukerjee (2000) and Fang et al. (2002, 2003b) derived lower bounds for fractions of two- and three-level factorials. In this paper we report some new lower bounds for the centered L 2-discrepancy for a set of asymmetric fraction factorials. Using these lower bounds helps to measure uniformity of a given design. In addition, as an application of these lower bounds, we propose a method to construct uniform designs or nearly uniform designs with asymmetric factorials. |
关键词 | Asymmetric factorial Centered L2-discrepancy Uniform design Uniformity |
DOI | 10.1007/s00184-005-0015-x |
URL | 查看来源 |
收录类别 | SCIE |
语种 | 英语English |
WOS研究方向 | Mathematics |
WOS类目 | Statistics & Probability |
WOS记录号 | WOS:000237655500008 |
Scopus入藏号 | 2-s2.0-33645292314 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | https://repository.uic.edu.cn/handle/39GCC9TT/2425 |
专题 | 个人在本单位外知识产出 |
通讯作者 | Qin, Hong |
作者单位 | 1.Department of Statistics, Visva-Bharati University, Santiniketan, India 2.Department of Mathematics, Hong Kong Baptist University, Hong Kong, Hong Kong 3.Department of Statistics, Central China Normal University, Wuhan 430079, China |
推荐引用方式 GB/T 7714 | Chatterjee, Kashinath,Fang, Kaitai,Qin, Hong. A lower bound for the centered L2-discrepancy on asymmetric factorials and its application[J]. Metrika, 2006, 63(2): 243-255. |
APA | Chatterjee, Kashinath, Fang, Kaitai, & Qin, Hong. (2006). A lower bound for the centered L2-discrepancy on asymmetric factorials and its application. Metrika, 63(2), 243-255. |
MLA | Chatterjee, Kashinath,et al."A lower bound for the centered L2-discrepancy on asymmetric factorials and its application". Metrika 63.2(2006): 243-255. |
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