Measuring the intensity of knowledge flow with patent statistics

doi:10.1016/S0165-1765(01)00558-4

科研成果详情

发表状态	已发表Published
题名	Measuring the intensity of knowledge flow with patent statistics
作者	Fung, Michael K.1; Chow, William W.2
发表日期	2002
发表期刊	Economics Letters
ISSN/eISSN	0165-1765
卷号	74 期号:3 页码:353-358
摘要	Our study is based on the patent data of 224 firms in the computer, chemical, and electronic and electrical industries worldwide. We find that on average 19.3% of the knowledge spillover is generated within the industries, with the rest stemming from other industries. Also, there is a significant positive relationship between technological overlap between firms and internal knowledge flow in an industry. © 2002 Elsevier Science B.V. All rights reserved.
关键词	Innovation Knowledge spillover Patent
DOI	10.1016/S0165-1765(01)00558-4
URL	查看来源
收录类别	SSCI
语种	英语English
WOS研究方向	Business & Economics
WOS类目	Economics
WOS记录号	WOS:000173809900011
Scopus入藏号	2-s2.0-0036019617
引用统计	被引频次：40[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	https://repository.uic.edu.cn/handle/39GCC9TT/8433
专题	个人在本单位外知识产出
作者单位	1.Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China 2.Department of Economics and HKUST Center for Economic Development,Hong Kong University of Science and Technology, Clearwater Bay, Kowloon, Hong Kong, China
推荐引用方式 GB/T 7714	Fung, Michael K.,Chow, William W. Measuring the intensity of knowledge flow with patent statistics[J]. Economics Letters, 2002, 74(3): 353-358.
APA	Fung, Michael K., & Chow, William W. (2002). Measuring the intensity of knowledge flow with patent statistics. Economics Letters, 74(3), 353-358.
MLA	Fung, Michael K.,et al."Measuring the intensity of knowledge flow with patent statistics". Economics Letters 74.3(2002): 353-358.