发表状态 | 已发表Published |
题名 | Measuring the intensity of knowledge flow with patent statistics |
作者 | |
发表日期 | 2002 |
发表期刊 | Economics Letters
![]() |
ISSN/eISSN | 0165-1765 |
卷号 | 74期号:3页码:353-358 |
摘要 | Our study is based on the patent data of 224 firms in the computer, chemical, and electronic and electrical industries worldwide. We find that on average 19.3% of the knowledge spillover is generated within the industries, with the rest stemming from other industries. Also, there is a significant positive relationship between technological overlap between firms and internal knowledge flow in an industry. © 2002 Elsevier Science B.V. All rights reserved. |
关键词 | Innovation Knowledge spillover Patent |
DOI | 10.1016/S0165-1765(01)00558-4 |
URL | 查看来源 |
收录类别 | SSCI |
语种 | 英语English |
WOS研究方向 | Business & Economics |
WOS类目 | Economics |
WOS记录号 | WOS:000173809900011 |
Scopus入藏号 | 2-s2.0-0036019617 |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | https://repository.uic.edu.cn/handle/39GCC9TT/8433 |
专题 | 个人在本单位外知识产出 |
作者单位 | 1.Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China 2.Department of Economics and HKUST Center for Economic Development,Hong Kong University of Science and Technology, Clearwater Bay, Kowloon, Hong Kong, China |
推荐引用方式 GB/T 7714 | Fung, Michael K.,Chow, William W. Measuring the intensity of knowledge flow with patent statistics[J]. Economics Letters, 2002, 74(3): 353-358. |
APA | Fung, Michael K., & Chow, William W. (2002). Measuring the intensity of knowledge flow with patent statistics. Economics Letters, 74(3), 353-358. |
MLA | Fung, Michael K.,et al."Measuring the intensity of knowledge flow with patent statistics". Economics Letters 74.3(2002): 353-358. |
条目包含的文件 | 条目无相关文件。 |
个性服务 |
查看访问统计 |
谷歌学术 |
谷歌学术中相似的文章 |
[Fung, Michael K.]的文章 |
[Chow, William W.]的文章 |
百度学术 |
百度学术中相似的文章 |
[Fung, Michael K.]的文章 |
[Chow, William W.]的文章 |
必应学术 |
必应学术中相似的文章 |
[Fung, Michael K.]的文章 |
[Chow, William W.]的文章 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论